SEM P-Z
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Image | Vendor | Model | Year | kV | Gun | Resolution (nm) | Features | List price | Ask price | Manual | Schem | SW | ||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Phillips | FEG XL 40 | EDAX | [[http:www.ebay.com/itm/PHILIPS-FEG-XL-40-SCANNING-ELECTRON-MICROSCOPE-W-EDAX-PV9760-57-/300980801721?pt=LH_DefaultDomain_0&hash=item4613da90b9 | 100,000]] | ||||||||||
Phillips | 501 | 1977 | 30 | 7 | [1970s] | |||||||||
Phillips | 501B | 1979 | 30? | 7? | EDS, WDS | [1970s] | ||||||||
Phillips | SEM 505 | 1980 | "new doped-yttrium silicate scintillator for the detection of backscattered electrons in its 1980 model SEM 505; this new detector was 200 times more sensitive to backscattered electrons than previous scintillators" [1980s] | |||||||||||
Phillips | SEM 515 | 1984 | "improved on the 505 by adding computer-controlled automatic focussing and astigmation correction" [1980s] | |||||||||||
Phillips | SEM 525 EB | 1985 | "created for functional testing of ICs" [1980s] | |||||||||||
Phillips | SEM 525 IC | 1985 | "designed for the non-destructive testing of semiconductor wafers" [1980s] | |||||||||||
Phillips | EM 300 accessory | 1968 | "attachment turned the TEM into an STEM" [1960s] | |||||||||||
Phillips | PSEM 500 | 1972 | 50 | 10 | "Philips' first SEM" [1970s] | |||||||||
Phillips | PSEM 500M | 1973 | 50? | 10? | "designed for larger samples, accommodating specimens with dimensions of 153 mm x 146 mm x 84 mm" [1970s] | |||||||||
Microscope:sem:dc:phillips:xl40:dc sem.jpg?300 | Phillips | XL-30 | W | 3.5nm @ 30kV | ||||||||||
RCA | EMU-3 | [[http:www.ebay.com/itm/RCA-Electron-Microscopes-Vintage-EMU-3-and-EMU-4-/331036772721?pt=LH_DefaultDomain_0&hash=item4d13544971 | 275,000 for EMU-3/4 (way overpriced?)]] | |||||||||||
RCA | EMU-4 | [[http:www.ebay.com/itm/RCA-Electron-Microscopes-Vintage-EMU-3-and-EMU-4-/331036772721?pt=LH_DefaultDomain_0&hash=item4d13544971 | 275,000 for EMU-3/4 (way overpriced?)]] | |||||||||||
SEC | SNE-1500M | [[http:siliconpr0n.org/media/sec/sne-1500m/SNE-1500M Manual_eng_042308[1].pdf | Yes]] | Tabletop | ||||||||||
SEC | SNE-3000M | Tabletop | ||||||||||||
SEC | SNE-3000MB | Tabletop | ||||||||||||
SEC | SNE-3200M | Tabletop | ||||||||||||
SEC | SNE-4500M | Tabletop | ||||||||||||
Seron | AIS2100C | |||||||||||||
Seron | AIS2200 | |||||||||||||
Seron | AIS2300C | |||||||||||||
Tescan | VEGA3 | [[http:siliconpr0n.org/media/tescan/vega3/VEGA_manual_GEN_3_04_tisk.pdf | Yes]] | |||||||||||
Topcon | ABT-32 | [[http:ds130.com/ABT-32.htm | 5]] | |||||||||||
Topcon | ABT-60 | [[http:ds130.com/ABT-60.htm | 4]] | |||||||||||
Topcon | ABT-150 | |||||||||||||
Topcon | SM-720 | [[http:ds130.com/SM-720.htm | 0.9]] | |||||||||||
Zeiss | DSM 960 | [[http:www.ebay.com/itm/ZEISS-SEM-Scanning-Electron-Microscope-Model-DSM-960-Turbo-Pump-/151026866735?pt=LH_DefaultDomain_0& | link]] | |||||||||||
Zeiss | NEON 40 EsB | FE | 2.5 nm @ 1 kV | "Canion FIB column" | ||||||||||
Zeiss | SIGMA | [[http:siliconpr0n.org/media/carl_zeiss/sigma/SEM_manual.pdf | Yes]] | |||||||||||
Zeiss | Supra 55VP | FE | 1.7 nm @ 1 kV 2 nm @ 30 kV (VP) |