Difference between revisions of "Main Page"
| Line 20: | Line 20: | ||
* [[Bonder]] | * [[Bonder]] | ||
* [[Probing]] | * [[Probing]] | ||
| − | * [[ | + | * [[Reactive Ion Etching]] |
Revision as of 01:42, 5 March 2019
This wiki collaboratively documents microscope techniques and other information. Its a spin off from [1] where its primary focus was to help maintain semiconductor microscopes. Unlike generic resources like Wikipedia, this wiki has a high focus on practical aspects, like info on maintaining specific microscope models.
Unless otherwise specified, content on this wiki is licensed under CC Attribution 4.0 International
Main pages
TODO:
News
2018-12-26
- Rough import from siliconpr0n.org
- Copy criteria: the primary purpose of the device is imaging, or dominated by an imaging device
- Definitely copy: optical, SEM, TEM
- Copy because dominate: FIB
- Don't copy: bonder, probe station / laser microscope
Contributing
Want an account? e-mail johndmcmaster at gmail.com explaining what you want to contribute
