Difference between revisions of "Infrared"

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(SWIR camera)
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Revision as of 07:05, 23 April 2019

This page focuses on SWIR for IC failure analysis. Note silicon bandgap is 1.14 eV => 1087 nm. General notes:

Technology Typical um Typical QE

@ ~1087 nm

Sample cameras Notes
InGaAs 0.9 to 1.7 SUI goodrich SU320KTSW Very good choice, but relatively high cost
HgCdTe (MCT) Axiom ZephIR
IR vidicon Hamamatsu C2741-03

FJW Find-R-Scope 85700

Back illuminated CMOS Touptek E3ISPM
Basic CMOS Amscope MU800
Cooled CCD Apogee U2
Basic CCD Shitty mall camera
Microbolometer Cuts of at around 1.4 um or something like that

Not suitable for emission use


Emission microscope

Alpha Innotech FA-1000

Is there a standard microscope or is it more a camera unit + software?

Relatively compact, stand alone camera system. Comes with small rack with computer and chiller. System weighs around 250 lb.

Hypervision BEAMS

Complete probe station setup. Uses Princeton instruments cameras. For some reason I think they are MCT, but I'm not sure why I believe that.

SWIR camera

Camera

Vendor

Camera

Model

Sensor

Technology

Typical

nm

Sensor

Resolution

Pixel

Size (um)

Sensor

Vendor

Sensor

Model

Output Notes
Allied Vision Technologies P-008 InGaAs 900-1700
Allied Vision Technologies P-032 InGaAs 900-1700
Alpha Innotech FA-1000 FIXME See above section
Axiom ZephIR MCT
FLIR Systems Alpha NIR InGaAs 900-1700 320x256 30x30
FLIR Systems Tua SWIR 640x512
FJW Find-R-Scope 85700
Hamamatsu C10633-13

C10633-23

32x256 USB

Analogic

Hamamatsu C10633-34 640x512 Analogic RS-232 control

Liquid cooled

Hamamatsu C2741-03
Hamamatsu C5840
Princeton Instruments OMAV 1000-2000 Linear Spectrometer
Princeton Instruments PloNIR InGaAs

TEC

400-1700 640x512 GigE
Sensors Unlimited / SUI Goodrich SU320KTSW
Xenics