Infrared
This page focuses on SWIR for IC failure analysis. Note silicon bandgap is 1.14 eV => 1087 nm. General notes:
Technology | Typical um | Typical QE
@ ~1087 nm |
Sample cameras | Notes |
---|---|---|---|---|
InGaAs | 0.9 to 1.7 | SUI goodrich SU320KTSW | Very good choice, but relatively high cost | |
HgCdTe (MCT) | Axiom ZephIR | |||
IR vidicon | Hamamatsu C2741-03
FJW Find-R-Scope 85700 |
|||
Back illuminated CMOS | Touptek E3ISPM | |||
Basic CMOS | Amscope MU800 | |||
Cooled CCD | Apogee U2 | |||
Basic CCD | Shitty mall camera | |||
Microbolometer | Cuts of at around 1.4 um or something like that
Not suitable for emission use |
Emission microscope
Alpha Innotech FA-1000
Is there a standard microscope or is it more a camera unit + software?
Relatively compact, stand alone camera system. Comes with small rack with computer and chiller. System weighs around 250 lb.
Hypervision BEAMS
Complete probe station setup. Uses Princeton instruments cameras. For some reason I think they are MCT, but I'm not sure why I believe that.
SWIR camera
Camera
Vendor |
Camera
Model |
Sensor
Technology |
Sensor
Vendor |
Sensor
Model |
Notes |
---|---|---|---|---|---|
Axiom | ZephIR | ||||
FJW | Find-R-Scope 85700 | ||||
Hamamatsu | C2741-03 | ||||
SUI Goodrich | SU320KTSW | ||||