Difference between revisions of "Infrared"

Revision as of 06:52, 23 April 2019

This page focuses on SWIR for IC failure analysis. Note silicon bandgap is 1.14 eV => 1087 nm. General notes:


Technology	Typical um	Sample cameras	Notes
InGaAs	0.9 to 1.7	SUI goodrich SU320KTSW	Very good choice, but relatively high cost
HgCdTe (MCT)		Axiom ZephIR
IR vidicon		Hamamatsu C2741-03 FJW Find-R-Scope 85700
Back illuminated CMOS		Touptek E3ISPM
Basic CMOS		Amscope MU800
Cooled CCD		Apogee U2
Basic CCD		Shitty mall camera
Microbolometer			Cuts of at around 1.4 um or something like that Not suitable for emission use

Is there a standard microscope or is it more a camera unit + software?

Relatively compact, stand alone camera system. Comes with small rack with computer and chiller. System weighs around 250 lb.

Complete probe station setup. Uses Princeton instruments cameras. For some reason I think they are MCT, but I'm not sure why I believe that.

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 |Shitty mall camera
 |
+|-
+|Microbolometer
+|
+|
+|
+|Cuts of at around 1.4 um or something like that
+Not suitable for emission use
 |}
 <br />
+== Emission microscope ==
+==== Alpha Innotech FA-1000 ====
+Is there a standard microscope or is it more a camera unit + software?
+Relatively compact, stand alone camera system. Comes with small rack with computer and chiller. System weighs around 250 lb.
+==== Hypervision BEAMS ====
+Complete probe station setup. Uses Princeton instruments cameras. For some reason I think they are MCT, but I'm not sure why I believe that.
+== SWIR camera ==
+{| class="wikitable"
+|+
+!Camera
+Vendor
+!Camera
+Model
+!Sensor
+Technology
+!Sensor
+Vendor
+!Sensor
+Model
+!Notes
+|-
+|Axiom
+|ZephIR
+|
+|
+|
+|
+|-
+|FJW
+|Find-R-Scope 85700
+|
+|
+|
+|
+|-
+|Hamamatsu
+|C2741-03
+|
+|
+|
+|
+|-
+|SUI Goodrich
+|SU320KTSW
+|
+|
+|
+|
+|-
+|
+|
+|
+|
+|
+|
+|-
+|
+|
+|
+|
+|
+|
+|}