Difference between revisions of "Infrared"
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− | + | This page focuses on SWIR for IC failure analysis. Note silicon bandgap is 1.14 eV => 1087 nm. General notes: | |
+ | {| class="wikitable" | ||
+ | |+ | ||
+ | !Technology | ||
+ | !Typical um | ||
+ | !Typical QE | ||
+ | @ ~1087 nm | ||
+ | !Sample cameras | ||
+ | !Notes | ||
+ | |- | ||
+ | |InGaAs | ||
+ | |0.9 to 1.7 | ||
+ | | | ||
+ | |SUI goodrich SU320KTSW | ||
+ | |Very good choice, but relatively high cost | ||
+ | |- | ||
+ | |HgCdTe (MCT) | ||
+ | | | ||
+ | | | ||
+ | |Axiom ZephIR | ||
+ | | | ||
+ | |- | ||
+ | |IR vidicon | ||
+ | | | ||
+ | | | ||
+ | |Hamamatsu C2741-03 | ||
+ | FJW Find-R-Scope 85700 | ||
+ | | | ||
+ | |- | ||
+ | |Back illuminated CMOS | ||
+ | | | ||
+ | | | ||
+ | |Touptek E3ISPM | ||
+ | | | ||
+ | |- | ||
+ | |Basic CMOS | ||
+ | | | ||
+ | | | ||
+ | |Amscope MU800 | ||
+ | | | ||
+ | |- | ||
+ | |Cooled CCD | ||
+ | | | ||
+ | | | ||
+ | |Apogee U2 | ||
+ | | | ||
+ | |- | ||
+ | |Basic CCD | ||
+ | | | ||
+ | | | ||
+ | |Shitty mall camera | ||
+ | | | ||
+ | |} | ||
+ | <br /> |
Revision as of 06:42, 23 April 2019
This page focuses on SWIR for IC failure analysis. Note silicon bandgap is 1.14 eV => 1087 nm. General notes:
Technology | Typical um | Typical QE
@ ~1087 nm |
Sample cameras | Notes |
---|---|---|---|---|
InGaAs | 0.9 to 1.7 | SUI goodrich SU320KTSW | Very good choice, but relatively high cost | |
HgCdTe (MCT) | Axiom ZephIR | |||
IR vidicon | Hamamatsu C2741-03
FJW Find-R-Scope 85700 |
|||
Back illuminated CMOS | Touptek E3ISPM | |||
Basic CMOS | Amscope MU800 | |||
Cooled CCD | Apogee U2 | |||
Basic CCD | Shitty mall camera |