SEM P-Z
Image | Vendor | Model | Year | kV | Gun | Resolution (nm) | Features | List price | Ask price | Manual | Schem | SW | Notes |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Phillips | FEG XL 40 | EDAX | 100,000 | ||||||||||
Phillips | 501 | 1977 | 30 | 7 | [1970s] | ||||||||
Phillips | 501B | 1979 | 30? | 7? | EDS, WDS | [1970s] | |||||||
Phillips | SEM 505 | 1980 | "new doped-yttrium silicate scintillator for the detection of backscattered electrons in its 1980 model SEM 505; this new detector was 200 times more sensitive to backscattered electrons than previous scintillators" [1980s] | ||||||||||
Phillips | SEM 515 | 1984 | "improved on the 505 by adding computer-controlled automatic focussing and astigmation correction" [1980s] | ||||||||||
Phillips | SEM 525 EB | 1985 | "created for functional testing of ICs" [1980s] | ||||||||||
Phillips | SEM 525 IC | 1985 | "designed for the non-destructive testing of semiconductor wafers" [1980s] | ||||||||||
Phillips | EM 300 accessory | 1968 | "attachment turned the TEM into an STEM" [1960s] | ||||||||||
Phillips | PSEM 500 | 1972 | 50 | 10 | "Philips' first SEM" [1970s] | ||||||||
Phillips | PSEM 500M | 1973 | 50? | 10? | "designed for larger samples, accommodating specimens with dimensions of 153 mm x 146 mm x 84 mm" [1970s] | ||||||||
Phillips | XL-30 | W | 3.5nm @ 30kV | ||||||||||
RCA | EMU-3 | 275,000 for EMU-3/4 (way overpriced?) | |||||||||||
RCA | EMU-4 | 275,000 for EMU-3/4 (way overpriced?) | |||||||||||
SEC | SNE-1500M | Manual_eng_042308[1.pdf Yes] | Tabletop ] | ||||||||||
SEC | SNE-3000M | Tabletop | |||||||||||
SEC | SNE-3000MB | Tabletop | |||||||||||
SEC | SNE-3200M | Tabletop | |||||||||||
SEC | SNE-4500M | Tabletop | |||||||||||
Seron | AIS2100C | ||||||||||||
Seron | AIS2200 | ||||||||||||
Seron | AIS2300C | ||||||||||||
Tescan | VEGA3 | Yes | |||||||||||
Topcon | ABT-32 | 5 | |||||||||||
Topcon | ABT-60 | 4 | |||||||||||
Topcon | ABT-150 | ||||||||||||
Topcon | SM-720 | 0.9 | |||||||||||
Zeiss | DSM 960 | link | |||||||||||
Zeiss | NEON 40 EsB | FE | 2.5 nm @ 1 kV | "Canion FIB column" | |||||||||
Zeiss | SIGMA | Yes | |||||||||||
Zeiss | Supra 55VP | FE | 1.7 nm @ 1 kV 2 nm @ 30 kV (VP) |