Difference between revisions of "Main Page"

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TODO:
 
TODO:
 
* [[Bonder]]
 
* [[Bonder]]
* [[Probe station]]
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* [[Probing]]
 
* [[RIE]]
 
* [[RIE]]
  

Revision as of 00:52, 5 March 2019

This wiki collaboratively documents microscope techniques and other information. Its a spin off from [1] where its primary focus was to help maintain semiconductor microscopes. Unlike generic resources like Wikipedia, this wiki has a high focus on practical aspects, like info on maintaining specific microscope models.

Unless otherwise specified, content on this wiki is licensed under CC Attribution 4.0 International

Main pages

SEM

TEM

FIB

Olympus

Technical Instruments

User:Mcmaster

TODO:


News

2018-12-26

  • Rough import from siliconpr0n.org
  • Copy criteria: the primary purpose of the device is imaging, or dominated by an imaging device
    • Definitely copy: optical, SEM, TEM
    • Copy because dominate: FIB
    • Don't copy: bonder, probe station / laser microscope

Contributing

Want an account? e-mail johndmcmaster at gmail.com explaining what you want to contribute