Difference between revisions of "SEM P-Z"
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− | !Image !!Vendor !!Model !!Year !!kV !!Gun !!Resolution (nm) !!Features !!List price !!Ask price !!Manual !!Schem !!SW !!Notes | + | !Image !!Vendor !!Model !!Year !!kV !!Gun !!Resolution (nm) !!Features !!List price !!Ask price !!Manual !!Schem !!SW !!Notes |
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− | | || Phillips || FEG XL 40 || || || || || EDAX || || | + | | || Phillips || FEG XL 40 || || || || || EDAX || || [http://www.ebay.com/itm/PHILIPS-FEG-XL-40-SCANNING-ELECTRON-MICROSCOPE-W-EDAX-PV9760-57-/300980801721?pt=LH_DefaultDomain_0&hash=item4613da90b9 100,000] || || || || |
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− | | || Phillips || 501 || 1977 || 30 || || 7 || || || || || || || [1970s] | + | | || Phillips || 501 || 1977 || 30 || || 7 || || || || || || || [1970s] |
|- | |- | ||
− | | || Phillips || 501B || 1979 || 30? || || 7? || EDS, WDS || || || || || || [1970s] | + | | || Phillips || 501B || 1979 || 30? || || 7? || EDS, WDS || || || || || || [1970s] |
|- | |- | ||
− | | || Phillips || SEM 505 || 1980 || || || || || || || || || || "new doped-yttrium silicate scintillator for the detection of backscattered electrons in its 1980 model SEM 505; this new detector was 200 times more sensitive to backscattered electrons than previous scintillators" [1980s] | + | | || Phillips || SEM 505 || 1980 || || || || || || || || || || "new doped-yttrium silicate scintillator for the detection of backscattered electrons in its 1980 model SEM 505; this new detector was 200 times more sensitive to backscattered electrons than previous scintillators" [1980s] |
|- | |- | ||
− | | || Phillips || SEM 515 || 1984 || || || || || || || || || || "improved on the 505 by adding computer-controlled automatic focussing and astigmation correction" [1980s] | + | | || Phillips || SEM 515 || 1984 || || || || || || || || || || "improved on the 505 by adding computer-controlled automatic focussing and astigmation correction" [1980s] |
|- | |- | ||
− | | || Phillips || SEM 525 EB || 1985 || || || || || || || || || || "created for functional testing of ICs" [1980s] | + | | || Phillips || SEM 525 EB || 1985 || || || || || || || || || || "created for functional testing of ICs" [1980s] |
|- | |- | ||
− | | || Phillips || SEM 525 IC || 1985 || || || || || || || || || || "designed for the non-destructive testing of semiconductor wafers" [1980s] | + | | || Phillips || SEM 525 IC || 1985 || || || || || || || || || || "designed for the non-destructive testing of semiconductor wafers" [1980s] |
|- | |- | ||
− | | || Phillips || EM 300 accessory || 1968 || || || || || || || || || || "attachment turned the TEM into an STEM" [1960s] | + | | || Phillips || EM 300 accessory || 1968 || || || || || || || || || || "attachment turned the TEM into an STEM" [1960s] |
|- | |- | ||
− | | || Phillips || PSEM 500 || 1972 || 50 || || 10 || || || || || || || "Philips' first SEM" [1970s] | + | | || Phillips || PSEM 500 || 1972 || 50 || || 10 || || || || || || || "Philips' first SEM" [1970s] |
|- | |- | ||
− | | || Phillips || PSEM 500M || 1973 || 50? || || 10? || || || || || || || "designed for larger samples, accommodating specimens with dimensions of 153 mm x 146 mm x 84 mm" [1970s] | + | | || Phillips || PSEM 500M || 1973 || 50? || || 10? || || || || || || || "designed for larger samples, accommodating specimens with dimensions of 153 mm x 146 mm x 84 mm" [1970s] |
|- | |- | ||
− | | | + | | [[File:microscope_sem_dc_phillips_xl40_dc_sem.jpg|300 px]] || Phillips || XL-30 || || || W || 3.5nm @ 30kV || || || || || || || |
|- | |- | ||
− | | || RCA || EMU-3 || || || || || || || | + | | || RCA || EMU-3 || || || || || || || [http://www.ebay.com/itm/RCA-Electron-Microscopes-Vintage-EMU-3-and-EMU-4-/331036772721?pt=LH_DefaultDomain_0&hash=item4d13544971 275,000 for EMU-3/4 (way overpriced?)] || || || || |
|- | |- | ||
− | | || RCA || EMU-4 || || || || || || || | + | | || RCA || EMU-4 || || || || || || || [http://www.ebay.com/itm/RCA-Electron-Microscopes-Vintage-EMU-3-and-EMU-4-/331036772721?pt=LH_DefaultDomain_0&hash=item4d13544971 275,000 for EMU-3/4 (way overpriced?)] || || || || |
|- | |- | ||
− | | || SEC || SNE-1500M || || || || || || || || | + | | || SEC || SNE-1500M || || || || || || || || [http://siliconpr0n.org/media/sec/sne-1500m/SNE-1500M Manual_eng_042308[1].pdf Yes] || || || Tabletop ] |
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− | | || SEC || SNE-3000M || || || || || || || || || || || Tabletop | + | | || SEC || SNE-3000M || || || || || || || || || || || Tabletop |
|- | |- | ||
− | | || SEC || SNE-3000MB || || || || || || || || || || || Tabletop | + | | || SEC || SNE-3000MB || || || || || || || || || || || Tabletop |
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− | | || SEC || SNE-3200M || || || || || || || || || || || Tabletop | + | | || SEC || SNE-3200M || || || || || || || || || || || Tabletop |
|- | |- | ||
− | | || SEC || SNE-4500M || || || || || || || || || || || Tabletop | + | | || SEC || SNE-4500M || || || || || || || || || || || Tabletop |
|- | |- | ||
− | | || Seron || AIS2100C || || || || || || || || || || || | + | | || Seron || AIS2100C || || || || || || || || || || || |
|- | |- | ||
− | | || Seron || AIS2200 || || || || || || || || || || || | + | | || Seron || AIS2200 || || || || || || || || || || || |
|- | |- | ||
− | | || Seron || AIS2300C || || || || || || || || || || || | + | | || Seron || AIS2300C || || || || || || || || || || || |
|- | |- | ||
− | | || Tescan || VEGA3 || || || || || || || || | + | | || Tescan || VEGA3 || || || || || || || || [http://siliconpr0n.org/media/tescan/vega3/VEGA_manual_GEN_3_04_tisk.pdf Yes] || || || |
|- | |- | ||
− | | || Topcon || ABT-32 || || || || | + | | || Topcon || ABT-32 || || || || [http://ds130.com/ABT-32.htm 5] || || || || || || || |
|- | |- | ||
− | | || Topcon || ABT-60 || || || || | + | | || Topcon || ABT-60 || || || || [http://ds130.com/ABT-60.htm 4] || || || || || || || |
|- | |- | ||
− | | || Topcon || ABT-150 || || || || || || || || || || || | + | | || Topcon || ABT-150 || || || || || || || || || || || |
|- | |- | ||
− | | || Topcon || SM-720 || || || || | + | | || Topcon || SM-720 || || || || [http://ds130.com/SM-720.htm 0.9] || || || || || || || |
|- | |- | ||
− | | || Zeiss || DSM 960 || || || || || || || | + | | || Zeiss || DSM 960 || || || || || || || [http://www.ebay.com/itm/ZEISS-SEM-Scanning-Electron-Microscope-Model-DSM-960-Turbo-Pump-/151026866735?pt=LH_DefaultDomain_0& link] || || || || |
|- | |- | ||
− | | || Zeiss || NEON 40 EsB || || || FE || 2.5 nm @ 1 kV || || || || || || || "Canion FIB column" | + | | || Zeiss || NEON 40 EsB || || || FE || 2.5 nm @ 1 kV || || || || || || || "Canion FIB column" |
|- | |- | ||
− | | || Zeiss || SIGMA || || || || || || || || | + | | || Zeiss || SIGMA || || || || || || || || [http://siliconpr0n.org/media/carl_zeiss/sigma/SEM_manual.pdf Yes] || || || |
|- | |- | ||
− | | || Zeiss || Supra 55VP || || || FE || <br />1.7 nm @ 1 kV <br /> <br />2 nm @ 30 kV (VP) || || || || || || || | + | | || Zeiss || Supra 55VP || || || FE || <br />1.7 nm @ 1 kV <br /> <br />2 nm @ 30 kV (VP) || || || || || || || |
|- | |- | ||
|} | |} |
Revision as of 11:28, 26 December 2018
Image | Vendor | Model | Year | kV | Gun | Resolution (nm) | Features | List price | Ask price | Manual | Schem | SW | Notes |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Phillips | FEG XL 40 | EDAX | 100,000 | ||||||||||
Phillips | 501 | 1977 | 30 | 7 | [1970s] | ||||||||
Phillips | 501B | 1979 | 30? | 7? | EDS, WDS | [1970s] | |||||||
Phillips | SEM 505 | 1980 | "new doped-yttrium silicate scintillator for the detection of backscattered electrons in its 1980 model SEM 505; this new detector was 200 times more sensitive to backscattered electrons than previous scintillators" [1980s] | ||||||||||
Phillips | SEM 515 | 1984 | "improved on the 505 by adding computer-controlled automatic focussing and astigmation correction" [1980s] | ||||||||||
Phillips | SEM 525 EB | 1985 | "created for functional testing of ICs" [1980s] | ||||||||||
Phillips | SEM 525 IC | 1985 | "designed for the non-destructive testing of semiconductor wafers" [1980s] | ||||||||||
Phillips | EM 300 accessory | 1968 | "attachment turned the TEM into an STEM" [1960s] | ||||||||||
Phillips | PSEM 500 | 1972 | 50 | 10 | "Philips' first SEM" [1970s] | ||||||||
Phillips | PSEM 500M | 1973 | 50? | 10? | "designed for larger samples, accommodating specimens with dimensions of 153 mm x 146 mm x 84 mm" [1970s] | ||||||||
Phillips | XL-30 | W | 3.5nm @ 30kV | ||||||||||
RCA | EMU-3 | 275,000 for EMU-3/4 (way overpriced?) | |||||||||||
RCA | EMU-4 | 275,000 for EMU-3/4 (way overpriced?) | |||||||||||
SEC | SNE-1500M | Manual_eng_042308[1.pdf Yes] | Tabletop ] | ||||||||||
SEC | SNE-3000M | Tabletop | |||||||||||
SEC | SNE-3000MB | Tabletop | |||||||||||
SEC | SNE-3200M | Tabletop | |||||||||||
SEC | SNE-4500M | Tabletop | |||||||||||
Seron | AIS2100C | ||||||||||||
Seron | AIS2200 | ||||||||||||
Seron | AIS2300C | ||||||||||||
Tescan | VEGA3 | Yes | |||||||||||
Topcon | ABT-32 | 5 | |||||||||||
Topcon | ABT-60 | 4 | |||||||||||
Topcon | ABT-150 | ||||||||||||
Topcon | SM-720 | 0.9 | |||||||||||
Zeiss | DSM 960 | link | |||||||||||
Zeiss | NEON 40 EsB | FE | 2.5 nm @ 1 kV | "Canion FIB column" | |||||||||
Zeiss | SIGMA | Yes | |||||||||||
Zeiss | Supra 55VP | FE | 1.7 nm @ 1 kV 2 nm @ 30 kV (VP) |